All-in-one test head resource for multi-parallelism, multi-task open architecture test systems with high-density analog and digital resource channels.
Flexible Module Assignment
Functional hardware modules can be easily configured as synchronous parallel sites, enhancing testing efficiency and throughput.
Flexible Integration
Supports seamless integration with various handlers and probers, enabling versatile testing setups across different manufacturing environments.
User-Friendly Software Environment
Operates on a Windows 7, 64-bit system with software tools developed in C/C++,providing a robust platform for customization and seamless integration into existing workflows.
Key Features
Maximum Voltage and Current Ratings:
±2000V/10A (DC Static)
Pulse 100A per channel with HPVIe (Gang-able for higher current)
±20V/1MHz AC source module
Precision Time Measurement resource (±50V) at resolution <30ps
±6.5V (55µV + 0.001%) 18 channels per board high precision resource for BMS
400Mbps digital board with 64-channel PPMU at 64M vector depth per bank
High-density analog and digital channels featuring all-in-one test head resources of 36 slots for full floating VI and high speed 400Mbps digital capability. Built for high parallelism and multi-task modes.
All AccoTEST test systems include comprehensive and no licence-based UI interface with full support for debug tools, waveform generation, and database generation tools with analytics.
