The preferred discrete to power semiconductor test system for low to high power MOSFETs, IGBTs, SiC, GaN, KGD, PIM, and IPM modules.
Comprehensive Parametric Measurement
Supports simultaneous testing of both static and dynamic parameters for IGBTs, MOSFETs, SiC, GaN, KGD and other individual components and modules.
Soft and Hard Docking Capable
Integration of turret or pick-and-place handler via cables or hard-docking approach for reduced stray inductance on dynamic tests.
Open Architecture Programming
Enables user specific test flow and methods with open architecture C++ programming of test resources.
Key Features
Maximum Voltage and Current Ratings:
±2000V/600A (DC Static)
100kHz-1MHz ZMU (±40V DC Bias up to ±2000V option)
Low leakage current range of ± 1nA
Precision 18-bit voltmeter measurement
IC resource digital capability
1200V/3000A dynamic test capabilities, hard or soft docking
Features system mainframe of 26 universal slots for Analog, Digital, PMIC and Power Modules test resources with full floating VI for high voltage and high current stacking capabilities. High power DC and dynamic resources are placed on the test head for hard docking and precision measurement as close to the device under test (“DUT”).
All AccoTEST test systems include comprehensive and no licence-based UI interface with full support for debug tools, waveform generation, and database generation tools with analytics.
