Optimal cost of test system for discrete to power MOSFETs with menu-driven programming, multi-stations capability.
Menu - Driven Programming
Ease of programming via drag-and-drop approach of test parameters libraries for discrete, MOSFETs, IGBTs and more.
Multi-Task / External Equipment's Integration
Multi-stations datalog are automatically combined into single format, be it STDF, excel or server logging. DPAT realtime formulation is also possible with external resources.
Expandability for Dynamic Test
Extension for high power DC up to 600A and dynamic test up to 3000A with plug-in approach of STS8200 AXE-Mini or DSU2.0 test heads.
Key Features
Maximum Voltage and Current Ratings:
±2000V/200A (DC Static with 600A option via STS8200 AXE-Mini)
±2500V/200A (Avalanche via UIS200 module)
1500W (55V/50A) Thermal Resistance via DVX900_PLUS
100kHz-1MHz ZMU (±40V DC Bias up to ±2000V option)
Low current measurement range of ±100nA
Dynamic test of 1200V/3000A via DSU2.0_PLUS
System mainframe of 26 slots allows multiple stations/multi-sides and supports advanced modes such as PingPong, TWIN with multi-tasks operations.
All AccoTEST test systems include comprehensive and no licence-based UI interface with full support for debug tools, waveform generation, and database generation tools with analytics.
